Fig. 1: Comparison of X-ray diffraction data.
From: Siliceous zeolite-derived topology of amorphous silica
a Total structure factors, S(k), of amorphous SiO2 materials prepared by cold compressions: pristine glassy SiO2 (GS), densified GS after cold compression with 20 GPa (C20-GS), densified amorphous SiO2 from bulk crystal siliceous zeolite after cold compression with 20 GPa (C20-bSZ), densified amorphous SiO2 obtained from siliceous zeolite powder by 7.7 GPa and 20 GPa cold compression (C7.7-pSZ and C20-pSZ, respectively); the dashed lines indicate the position of the scattering vector for k0 and k1 in GS without densification. b Enlarged S(k) in the FSDP region of amorphous SiO2.
