Table 1 Parameters used in MemSim+ model and their corresponding nominal values of SDC and ECM memristors

From: Realistic behavioral model for ReRAMs capturing non-idealities

Parameters

Explanation

Nominal values

  

SDC

ECM

Roff

Resistance at HRS.

180 kΩ

1933.15 Ω

Ron

Resistance at LRS.

13.9079 kΩ

174 Ω

voff

SET threshold voltage.

0.34 V

1.56 V

von

RESET threshold voltage.

−0.2145 V

−0.39 V

koff

Coefficient of state change rate during SET.

12.4 mm s−1

121.7 mm s−1

kon

Coefficient of state change rate during RESET.

−2.3 mm s−1

− 7.6 mm s−1

θoff

Coefficient of resistance drift after SET

705.433 ms−1

0

θon

Coefficient of resistance drift after RESET

1013.65 ms−1

410.25 ms−1

Ï„

Drift fade-out time constant

5 s

50 s

αoff

Degree of (non-)linearity for SET.

2

2

αon

Degree of (non-)linearity for RESET.

2

2

\({w}_{\max }\)

Value of state variable at LRS.

3 nm

3 nm

\({w}_{\min }\)

Value of state variable at HRS.

0 nm

0 nm