Table 1 Parameters used in MemSim+ model and their corresponding nominal values of SDC and ECM memristors
From: Realistic behavioral model for ReRAMs capturing non-idealities
Parameters | Explanation | Nominal values | |
|---|---|---|---|
| Â | Â | SDC | ECM |
Roff | Resistance at HRS. | 180 kΩ | 1933.15 Ω |
Ron | Resistance at LRS. | 13.9079 kΩ | 174 Ω |
voff | SET threshold voltage. | 0.34 V | 1.56 V |
von | RESET threshold voltage. | −0.2145 V | −0.39 V |
koff | Coefficient of state change rate during SET. | 12.4 mm s−1 | 121.7 mm s−1 |
kon | Coefficient of state change rate during RESET. | −2.3 mm s−1 | − 7.6 mm s−1 |
θoff | Coefficient of resistance drift after SET | 705.433 ms−1 | 0 |
θon | Coefficient of resistance drift after RESET | 1013.65 ms−1 | 410.25 ms−1 |
τ | Drift fade-out time constant | 5 s | 50 s |
αoff | Degree of (non-)linearity for SET. | 2 | 2 |
αon | Degree of (non-)linearity for RESET. | 2 | 2 |
\({w}_{\max }\) | Value of state variable at LRS. | 3 nm | 3 nm |
\({w}_{\min }\) | Value of state variable at HRS. | 0 nm | 0 nm |