Fig. 3: Atomic configuration and diffraction of amorphous Si.
From: Evidence of underlying structural similarities of amorphous materials
a Amorphous Si model simulated using molecular dynamics, together with a Si tetrahedral unit shown in the inset. The coordination analysis reveals that 88.3% of Si atoms are fourfold coordinated, 11.5% are fivefold, and 0.2% are sixfold, indicating that the model is composed mainly of tetrahedrally bonded Si atoms, consistent with low-density amorphous Si produced by rapid quenching. b Local structure extracted from the model shown in (a). c Simulated ABED pattern of the structural model shown in (b). d Experimental ABED pattern of amorphous HfO2 as a reference.
