Fig. 3: Atomic-scale characterization of the deformation substructure. | Communications Materials

Fig. 3: Atomic-scale characterization of the deformation substructure.

From: Stress-dependent χ phase transformation in a Ni-based superalloy

Fig. 3

High magnification HAADF-STEM image of (a/b) twin-lath, (c) η-SESF, (d) η-twin, and (e) twin-less lath traversing the γ channel across two precipitates with \({{{\boldsymbol{ < }}}}\overline{{{11}}}{{0}}{{{\boldsymbol{ > }}}}\) beam direction. Dashed orange lines indicate separation between γ′ and γ′ phases.

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