Fig. 2: ∅CAO accurately estimates aberrations in simulated images under noisy conditions.
From: Phase-based computational adaptive optics enables artifact-free super-resolution microscopy
Theoretical 3D point objects with large Seidel (a) or Zernike (c) aberrations and corresponding wavefronts. Point objects were displayed with a gamma = 0.5 to enhance low-intensity features. b, d Measured versus ground-truth aberration magnitudes estimated by ∅CAO from images in a, c. Zernike mode are numbered according to Wyant indices. Values shown correspond to the 2nd and 20th iterations for b, d, respectively. e Top and side views of simulated filament-like structures: unaberrated, aberrated, and aberrated but corrected by ∅CAO. f Measured versus ground-truth aberration magnitudes from e, shown after the 2nd iterations. g Aberration magnitude estimated by ∅CAO across five iterations. Inset shows root mean square (RMS) wavefront error; zero iteration indicates no correction. h Simulation results illustrating measurement accuracy for spherical aberration (SA), coma and corresponding Zernike modes (denoted as “z-“ followed by Wyant indices) under varying signal-to-noise ratios (SNRs). Normalized mean square error of the measured aberration values is plotted. Insets show top views of simulated single-point light source images used in the analysis.
