Fig. 5: Uncertainty estimation by B-SIM.
From: Approaching maximum resolution in structured illumination microscopy via accurate noise modeling
a B-SIM reconstruction for the high SNR simulated line pairs of Section “Simulated data: line pairs”. Scale bar 300 nm. b Marginal posterior probability distributions for fluorescence intensity at each pixel along the line cut in (a). The mean is shown in red, along with 50% confidence intervals in black. Scale bar 120 nm. c B-SIM reconstruction of mitochondria networks with high photon counts from Section “Experimental data: mitochondria network in HeLa cells”. Scale bar 2.0 μm. The region of interest (ROI) in the orange box is shown in the inset. d Marginal posterior distributions along the line cut in c. Same color map as in (b). Scale bar 195 nm.
