Atomic force microscopy-infrared (AFM-IR) spectroscopic imaging techniques offer a non-perturbative, molecular contrast for characterization of nanomaterials; however, data are often complicated by the measurement apparatus, sample preparation conditions and low signal-to-noise ratio. Here, the authors demonstrate a closed-loop controlled AFM-IR instrument design to address measurement artifacts and reduce noise up to 5x compared to previous methods.
- Seth Kenkel
- Shachi Mittal
- Rohit Bhargava
