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Showing 1–4 of 4 results
Advanced filters: Author: Youran Hong Clear advanced filters

  • By tracking atomic motion pulse-by-pulse, this work reveals “upwind” electromigration against electron flow in next-generation interconnects. This paradigm diverges from common electromigration, guiding reliability design for future electronics.

    • Youran Hong
    • Tianqi Deng
    • Jiangwei Wang
    ResearchOpen Access
    Nature Communications
    P: 1-8

  • The origin of the degradation of nanodevices under electrical pulses still remains unknown. Here, Li et al. reveal the mechanism of direct electron-dislocation interaction by decoupling the electron wind force using in situ electropulsing, providing atomistic insight into the electroplasticity.

    • Xing Li
    • Qi Zhu
    • Ze Zhang
    ResearchOpen Access
    Nature Communications
    Volume: 13, P: 1-9

  • Potassium-ion battery is a promising candidate for post-Li-ion energy storage but the lack of cathode materials hinders practical exploitation. Here the authors investigate defect-free potassium manganese hexacyanoferrate as cathode active material for high energy and long lifespan K-based cells.

    • Leqing Deng
    • Jiale Qu
    • Yujie Zhu
    ResearchOpen Access
    Nature Communications
    Volume: 12, P: 1-9