Table 1 The depth and width values (SEM measurement results) of nine samples

From: Fast and accurate measurement of high aspect ratio MEMS trench array with optical lattice illumination

Sample ID

Depth (μm)

Width (μm)

Aspect ratio

SEM uncertainty (nm)

1#

111.00

1.91

58.12

116.48

2#

144.00

5.08

28.35

67.88

3#

175.00

10.10

17.33

67.88

4#

122.00

2.58

47.29

67.88

5#

41.90

1.85

22.65

40.59

6#

43.00

2.06

20.87

40.59

7#

45.30

2.44

18.57

22.61

8#

41.20

1.67

24.67

22.61

9#

42.50

1.87

22.73

22.61