Fig. 4: Ultrafast Temperature Field Detection and Identification Using TDI-DQS.
From: Temperature field ultrafast detection and identification quantum sensor based on diamond array
a The TDI-DQS performs temperature field detection and real-time data processing, enabling ultra-fast identification of electronic device faults by evaluating output current characteristics. b Schematic of the ANN classifier (adapted to 9 × 3 array scale TDI-DQS), through which the temperature field of three different types of faults of electronic equipment is trained with label classification task: ‘Battery failure(I1)’, ‘Radiator failure (I2)’ and ‘Chip failure (I3)’. The right training results show that the loss function decreased to 0.01 within 200 training epochs. c Post-training temperature responsivity distribution of the sensor. d Experimental setup for temperature field recognition, using insulated NiCr heating elements to apply multi-pixel temperature fields. e Sensor output currents for three different types of temperature fields
