Fig. 3: Dependence of ${e}_{31,f}$ on dielectric constant in the present work and in literature-reported BiFeO3-based films, characterized by direct (filled symbols) and converse (open symbols) piezoelectric effects. | Microsystems & Nanoengineering

Fig. 3: Dependence of ${e}_{31,f}$ on dielectric constant in the present work and in literature-reported BiFeO₃-based films, characterized by direct (filled symbols) and converse (open symbols) piezoelectric effects.

From: Enhanced electromechanical coupling in piezoelectric MEMS vibration energy harvesters via strain-induced phase transition in Mn-doped bismuth ferrite epitaxial films

Fig. 3: Dependence of
$${e}_{31,f}$$

e

31
,
f

on dielectric constant in the present work and in literature-reported BiFeO3-based films, characterized by direct (filled symbols) and converse (open symbols) piezoelectric effects.

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