Fig. 1: Shear thermal deformation (STD) and interlayer shear thermal deformation (ISTD) in van der Waals materials and heterostructures.
From: Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials
a ISTD model of an N-layer phosphorene/SiO2 system when temperature decreases from T0 to T1. b ISTD model of a WSe2/N-layer phosphorene/SiO2 system when temperature decreases from T0 to T1. Here, N is the total layer number of phosphorene. n is the n-th (1 ≤ n ≤ N) phosphorene layer counting from bottom. τ (n) is the STD of the n-th phosphorene and Δτ (n) is the ISTD between the n-th and (n−1)-th phosphorene from T0 to T1.
