Fig. 3: Temperature-dependent PL characterizations.
From: Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials
a Schematic diagram of PL characterizations on WSe2/SiO2 and WSe2/phosphorene/SiO2 regions. b PL of neutral exciton (X), charged exciton (Xtrion) and localized exciton (Xloc) in isolated WSe2 on SiO2 substrate and WSe2/phosphorene heterostructure from 10 to 300 K. The red dashed lines serve as guide lines. c The normalized PL spectra of isolated WSe2 (gray lines) and WSe2/phosphorene heterostructure (blue lines) at 10, 200, and 300 K. Here, the gray-blue arrows indicate that the photon energy of X and Xtrion in WSe2/phosphorene/SiO2 heterostructure is blue-shifted/red-shifted relative to those in WSe2/SiO2.
