Fig. 5: Atomic scale characterization of the composite phase interface (ZNSS/Ti-ZNSS).
From: Phase interface engineering enables state-of-the-art half-Heusler thermoelectrics
The yellow line in the (a) represents Ti element line scanning information, while (b) is an enlarged HADDF region within the pink box, and the inset displays the Z- contrast map of the yellow line. Further magnification of the HADDF atomic structure image is presented in (c) corresponding to the [100] HADDF image and normalized intensity of Ti columns in d.
