Fig. 7: Comparison of microstructural features of the electron backscatter diffraction (EBSD) map with synthetic microstructures created by DREAM.3D, SliceGAN, and integrated SliceGAN-DREAM.3D, in terms of the Kolmogorov-Smirnoff (KS) values for descriptors viz.
a The equivalent grain size, b aspect ratio, and c misorientation distribution.
