Fig. 1: Extract deep features from 3D anticounterfeiting FNDs via metric learning.
From: High-dimensional anticounterfeiting nanodiamonds authenticated with deep metric learning
a Schematic illustration of obtaining 3D anticounterfeiting information based on LPM curves of the FNDs with random orientations. b Schematic illustration of extracting deep features from 3D encoded information via a metric learning network.
