Fig. 6: Comparison of classification and metric learning methods for PUF label authentication.
From: High-dimensional anticounterfeiting nanodiamonds authenticated with deep metric learning
a Schematic diagram showing the difference in the amount of data required during the training process. b Schematic diagram showing the difference in the authentication process and the capability to authenticate unseen PUF labels, where the classifier cannot evaluate unseen class labels based on predicted class probabilities. “Key” denotes the anticounterfeiting information from a single readout of a PUF label.
