Fig. 4: Micro/nanostructure characterization of (AgCu)0.998Te0.8Se0.1S0.1.
From: Strategic vacancy engineering advances record-high ductile AgCu(Te, Se, S) thermoelectrics
a, b Low- and c, d high-magnification transmission electron microscopy (TEM) images and corresponding select area electron diffraction (SAED) patterns of the samples prepared using focused ion beam (FIB) technology. e High-resolution TEM (HRTEM) image taken from a normal area. f Corresponding strain maps. g HRTEM image taken from the grain boundary. h–i Scanning transmission electron microscopy (STEM) image and corresponding EDS maps of Ag, Cu, Te, Se, S.
