Fig. 2: Temperature-dependent XRD data of slow-quenching Lu:Hf0.6Zr0.4O2 and Lu:HfO2 bulk crystals. | Nature Communications

Fig. 2: Temperature-dependent XRD data of slow-quenching Lu:Hf0.6Zr0.4O2 and Lu:HfO2 bulk crystals.

From: Unlocking the phase evolution of the hidden non-polar to ferroelectric transition in HfO2-based bulk crystals

Fig. 2

a Experimental data of the Lu:Hf0.6Zr0.4O2 (9.25 at.%) crystal over 30 to 1000 °C range. The color bar corresponds to the normalized diffraction intensity over the detected 2θ range (52°–57° and 65°–77°). b Detailed XRD data of the Lu:Hf0.6Zr0.4O2 (9.25 at.%) before and after the heating-cooling cycle. c Intensity ratio for the diffraction peaks around 53.5° (from the o phase) and 60° (from the o and t phases) calculated based on the temperature-dependent XRD data, for Lu:HfO2 (10 at.%) and Lu:Hf0.6Zr0.4O2 (9.25 at.% and 10 at.%) bulk crystals. d Manipulation of the phase transformation from the metastable t phase via introducing Zr4+ ions into Lu:Hf1-xZrxO2 bulk crystals. Tt-min denotes the minimum stabilization temperature of the t phase.

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