Fig. 3: In situ compression, cyclic test and simulation.
From: Micrometer-scale poly(ethylene glycol) with enhanced mechanical performance

A In situ SEM compression of PEG-Based Micropillar. Scale bar: 10 μm. B Engineering stress-strain curves of 10 cyclic tests of PEG-based micropillar. C SEM images of the PEG-based micropillar before and after the cyclic compression. Scale bar: 5 μm. D Coarse-grained modeling of the photoresist and the largest interconnected molecular cluster in the cured network. E, F Compressive true stress–strain curves from simulated cured network (red line) and experimental measurements (black lines).