Fig. 2: Crystalline and spatial distribution of SEI.

FESEM images of the SEI Zn (a) before cycle, (b) after 1 cycle and c after 3 cycles, respectively. d, e TEM images and f corresponding HRTEM image of the interphase after 3 cycles. g TOF-SIMS 3D reconstruction of the cycled SEI Zn surface (Negative ion mode was selected. Note that the scales of the x-axis and y-axis are different from those of the z-axis direction. The former represents the raster size and the latter means the sputter depth. Among them, the raster size is 50 × 50 μm, the sputter rate is 0.84 nm s−1 on GaN with a sputter time of 1500 s). h TOF-SIMS depth profiles on the cycled SEI Zn surface. i–k Corresponding 2D element distribution map of TOF-SIMS. Note that MC represents the maximum counts, and TC means the total intensity of secondary ions.