Fig. 3: Characterizations of micro/nanostructures for screen-printed Ag2Se films with 5 wt.% Te.
From: Flexible Ag2Se-based thin-film thermoelectrics for sustainable energy harvesting and cooling
a Low-magnification high-angle annular dark-field (HAADF) image of the specimen fabricated by focused ion beam (FIB) technique. b Enlarged HAADF image and its corresponding EDS maps for Ag, Se, and Te elements. c Magnified spherical aberration-corrected scanning TEM (Cs-STEM) HADDF image taken from the selected area of (a). The inset shows the corresponding fast Fourier transform (FFT) pattern with the view zone axis of [0 1 0]. d Low-magnification TEM image derived from (a). e High-resolution TEM (HRTEM) image taken from (d). f Magnified HRTEM image of the Ag2Se matrix. The inset shows the corresponding selected area electron diffraction (SAED) pattern viewing along the (0 1 0) direction. g HRTEM image with potential lattice imperfections taken from (d). h Corresponding strain maps along different directions. i Inverse Fourier transform image taken from (g) presents the potential presence of edge-like dislocations. The inset shows a magnified area with a potential edge-like dislocation.
