Fig. 3: Statistical analysis of scalability over a wafer. | Nature Communications

Fig. 3: Statistical analysis of scalability over a wafer.

From: Wafer-scale fabrication of memristive passive crossbar circuits for brain-scale neuromorphic computing

Fig. 3

a, b Statistical histograms and the corresponding wafer map of the memristor yield for all dies (i.e., 69 crossbar circuits) over the wafer. Each die represents a passive crossbar circuit. The yield estimation for each die was based on 100 memristors positioned in the same region across all circuits because of the limited package resources. Uniform device yield of 94.71 ± 4.18 % was confirmed over the wafer irrespective of the wafer’s location. c–h Statistical histograms and their corresponding wafer maps of switching parameters VSET (c, f), VRESET (d, g), and DR (e, h) for all the switchable memristors (6535) across all crossbar circuits (69). The VSET, VRESET, and DR were obtained from the same definitions in Fig. 2.

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