Fig. 1: Extended defects in perovskite oxides thin films.
From: Defect engineering in BaSnO3 and SrSnO3 thin films through nanoscale substrate patterning
a Illustration of threading 1D line defects in perovskite oxide thin films grown on a substrate along with atomic models of common [001]/(100)-type and [001]/(110)-type edge dislocations with B-terminated cores. The [001]/(110)-type dislocation has a dissociated core with an antiphase boundary in the middle. b Illustration of threading 2D planar defects in perovskite oxide thin films. RP fault loops are in orange and grain boundaries are in purple. Atomic models of RP fault and antiphase boundary are shown in the panels below. c HAADF-STEM images of both types of edge dislocations and a RP fault loop from a BaSnO3 film. The Burgers loops are shown. STEM-EDX maps (the panels on the right) show the Sn-termination of the [001]/(100)-type dislocation core, the antiphase structure of dissociated cores of [001]/(110)-type dislocation and facing BaO planes of the RP fault. Scale bars are 1 nm for the HAADF images and 5 Å for the EDX maps.
