Fig. 4: Evolutions of SBs and NCs for CTC30 during tension.

a The cross-sectional HRTEM image of the SB in CTC30 with εp of 4%. The shear propagation traces are indicated by white arrows. The inset shows the cross-sectional HAADF-STEM image of the SB and the corresponding shear offset in (a). b The corresponding SAED pattern of (a). c The magnified HRTEM image of yellow square region in (a). d Inversed FFT image of (c). e The micrographs of the SBs in CTC30 with εp of 10%. The tilt angles α of HRTEM micrographs is 10°. f The magnified HRTEM image of the larger yellow square region in (e). Inset shows the corresponding SAED pattern. g The magnified HRTEM image of the smaller yellow square region in (e). h Inversed FFT image of (g). i HAADF-STEM micrograph and the EDS mappings of shear band in CTC30 with tensile strain of 10%. j The elemental net intensity profiles along the dashed line which crosses the SB1 and SB2 in Supplementary Fig. 28a. Source data are provided as a Source Data file.