Fig. 3: Fine-structure characterizations of R-0Ce and R-0.2Ce samples.

a XRD refinement data of R-0.2Ce. b XRD refinement data of R-0Ce. c Normalized Ni K-edge XANES data of the R-0.2Ce and R-0Ce. d Ni K-edge EXAFS data of R-0.2Ce and R-0Ce in R-space. e Fourier transform of the k3-weighted EXAFS curves (empty dots) and fit model (red line) for the reduced R-0.2Ce samples. The light gray shadow indicates the fitted region. f R-0.2Ce k3-weighted wavelet transform plots of Ni K-edge EXAFS spectra. g R-0Ce k3-weighted wavelet transform plots of Ni K-edge EXAFS spectra.