Fig. 1: Sample cross-section from run #1.

a Combined X-ray maps of Si (white), Ca (blue), and Fe (red), showing quenched liquid metal, silicate melt, CaSiO3 davemaoite (Dvm,) and the SiO2 phase. b Back-scattered electron (BSE) image. The SCAPS images of secondary ions intensity ratios of H/Si and C/Si. The H and C contents in silicate melt were determined from the regions of interest (ROIs, enclosed by black lines in (c, d)) in an area free from the lens-flare effects of the secondary ion optics (see Supplementary Fig. 16 and “Methods”) and metal blobs (see the BSE image in (b)). A quenched metal portion in (c) and (d) is from the X-ray map in (a). Note that a, c/d, and b are slightly different cross sections because of sputtering by the SIMS ion beam and repolishing with a focused ion beam in between. Scale bar, 10 µm.