Fig. 5: In situ synchrotron X-ray diffraction (SXRD) tensile tests at RT and elevated temperatures. | Nature Communications

Fig. 5: In situ synchrotron X-ray diffraction (SXRD) tensile tests at RT and elevated temperatures.

From: High-temperature strength in an additively manufactured Al-based superalloy with stable nanoscale eutectic cellular networks

Fig. 5: In situ synchrotron X-ray diffraction (SXRD) tensile tests at RT and elevated temperatures.

Lattice strain evolution of different crystalline planes of Al11La3 and the average lattice strain of α-Al in the AlLaScZr-ECN and AlLaScZr-NP alloys at a RT and b 300 °C; Evaluated phase stress partitioning of the AlLaScZr-ECN and AlLaScZr-NP alloys during in situ tensile testing, plotted against the engineering stress–strain curves at c RT and d 300 °C. Error bars refer to the strain/stress uncertainties of measurements.

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