Fig. 4: Scanning transmission electron microscopy (STEM) analysis of LiMnSbTe3.

a Low-magnification high-angle annular dark field (HADDF)-STEM image. b Selected area electron diffraction (SAED) pattern on the highlighted area in a. c Elemental mapping of Sb, Mn, and Te in the area highlighted with red rectangular. d High-magnification HADDF-STEM image. e and f Atomic configuration of pseudo vdW-like gaps in different orientations. g Virtual bright-field (BF) image, h differential phase-contrast (DPC) image, and i Electric-field image of areas shown in e. The inset shows the color wheel where the color indicates the direction of the electric field, and the shade corresponds to the intensity.