Fig. 4: Spectrometer intrinsic resolution.

a A plot comparing the resolution, detection channel, and footprint scale for selected device demonstrations in the literature. The footprint scale includes the elements in the device that are active in resolving and detecting light, excluding the accessory components. Reference numbers are indicated within square brackets. b Simulation results of the device resolution performance improved by the interaction length (L). The red line represents the result based on the current material and fabrication level with a phonon Q  ~ 3000. The blue line shows the resolution with an improvement of phonon Q  ~ 20000 in future experiments. The dots represent the simulation results with the impact from the phase-matching diffusion and the shadow part represents the standard deviation of the resolution. The standard deviation of the random diffusion value added in simulation is about 1500 rad/m, which represents the standard derivation of waveguide width (Δw) around 4 nm and film thickness (Δt) around 0.5 nm. c The heatmap represents the relationship between mismatching value Δβ and variation error on Δw and Δt. The cyan line corresponds to the diffusion value in b.