Fig. 2: Subsurface atomic site modulation engineering.
From: Atomic diffusion pathway mediated subsurface engineering
HAADF-STEM image and corresponding EDS mapping of individual L10-PtFe@PtRu NP (a), L10-PtFe@PtRh NP (b), L10-PtFe@PtPd NP (c), L10-PtFe@PtAg NP (d). The corresponding intensity profile of mixed-element mapping is shown to the right of the elemental mapping image. Scale bar, 2 nm. e–g XPS spectra of M 3d, Pt 4 f in L10-PtFe@PtRhsub/C, L10-PtFe@PtRdsub/C, and L10-PtFe@PtAgsub/C excited by photons with different energies. h Depth profile of M concentration in L10-PtFe@PtMsub/C, with the concentration normalized to the value at a kinetic energy of 470 eV. Source data for the XPS are provided as a Source Data file.
