Fig. 1: Structural characterisations of the Sm-based infinite layer nickelate thin films. | Nature Communications

Fig. 1: Structural characterisations of the Sm-based infinite layer nickelate thin films.

From: Enhanced superconductivity and mixed-dimensional behaviour in infinite-layer samarium nickelate thin films

Fig. 1: Structural characterisations of the Sm-based infinite layer nickelate thin films.The alternative text for this image may have been generated using AI.

a–d The X-ray diffraction (XRD) θ–2θ symmetric patterns of Sm0.8Sr0.2NiO2 (SSNO), Sm0.74Ca0.01Sr0.19Eu0.06NiO2 (SCSE0.06), Sm0.79Ca0.04Sr0.05Eu0.12NiO2 (SCSE0.12) Sm0.75Ca0.05Eu0.2NiO2 (SCE0.2) thin films. Inset of (a) is a schematic diagram of the atomic structure. Resistivity curves ρ(T) of SSNO, SCSE0.06, SCSE0.12 and SCE0.2 samples are shown in (e–h). Insets of (e–h) show the zoom-in data around the superconducting transitions. Dashed lines are linear fits to the normal state ρ(T) curves above the transitions. Here, Tc,onset is defined as the point where the curve deviates from the linear fitting, Tc,0 is defined as the zero-resistance Tc. i, j are high-angle annular dark-field (HAADF) images of an SSNO thin film and an SCSE0.06 thin film. The c-axis lattice constants are measured to be 3.34 Å for SSNO and 3.28 Å for SCSE0.06. The area circulated by yellow dashed line indicates a Ruddlesden-Popper (RP) stacking fault.

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