Fig. 4: Single atomic tracking at different temporal resolutions. | npj Computational Materials

Fig. 4: Single atomic tracking at different temporal resolutions.

From: Exploring electron-beam induced modifications of materials with machine-learning assisted high temporal resolution electron microscopy

Fig. 4: Single atomic tracking at different temporal resolutions.

a–d Analysis from 5, 10, 20 and 50 fps acquired milling processes. (i) The initial processed frame with the selected Mo and S site selected to be tracked. (ii) A three dimensional plot that tracks the location and movement and change in the class of the atomic site with red = Mo, blue = S2, and green = S1 site or single VS. (iii) The final processed frame showing the location of the atomic species or where the site was removed. Image FOV in (a) 3.0 × 3.0 nm and (b–d) 1.6 × 1.6 nm.

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