Fig. 5: Full frame tracking of atomic disordering at different temporal resolution. | npj Computational Materials

Fig. 5: Full frame tracking of atomic disordering at different temporal resolution.

From: Exploring electron-beam induced modifications of materials with machine-learning assisted high temporal resolution electron microscopy

Fig. 5: Full frame tracking of atomic disordering at different temporal resolution.

a, b Atom tracking of full frames (i-iv) of different scans taken at 10 and 50 fps respectively going from pristine lattice (i) to the disordering and formation of defects (ii-iii) until the formation of the nanopore (iv). The decoded tracking of the full frame of the atom sites, viewed from both the top (v) and side (vi) view to visualize atomic motion in the xy plane as well as in time. Image FOV in both (a) and (b) (i–iv) is 1.6×1.6 nm.

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