Fig. 9: Microstructure characterization of two alloys (Si-4 and Se-5). | npj Computational Materials

Fig. 9: Microstructure characterization of two alloys (Si-4 and Se-5).

From: Discovering novel lead-free solder alloy by multi-objective Bayesian active learning with experimental uncertainty

Fig. 9

Optical microstructure images of alloys: a Si-4 and b Se-5; Backscattered electron (BSE) images of alloys: c Si-4, d Se-5; e EDS elemental distribution mapping of two alloys (Si-4 and Se-5), which correspond to the regions marked in (c, d); f X-ray Diffraction Patterns; SEM images (Secondary electron image) of fracture fractographs of g, h Si-4 and i, j Se-5.

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