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Showing 1–1 of 1 results
Advanced filters: Author: Benjamin A. Helfrecht Clear advanced filters

  • Atomic force microscopy is used to investigate the adsorption and organization of ions on charged surfaces. Trivalent ions adopt complex networks, clusters and layers associated with overcharging, whereas divalent ions follow classical predictions.

    • Mingyi Zhang
    • Benjamin A. Legg
    • James J. De Yoreo
    Research
    Nature Materials
    P: 1-8