Investigating Experimental Short Term Imprint Dynamics in Ferroelectric Hafnium Oxide Through Phase‐Field Modeling
- Journal:
- Advanced Functional Materials
- Published:
- DOI:
- 10.1002/adfm.202514094
- Affiliations:
- 3
- Authors:
- 11
| Institutions | Authors | Share |
|---|---|---|
| Lyon Nanotechnology Institute (INL), France | 1.00 |