Dual‐Mode Optoelectronic Neuromorphic Memory for Complex Edge Detection and Recognition

Journal:

Advanced Functional Materials

Published:

2025-08-27

DOI:

10.1002/adfm.202514949

Affiliations:

6

Authors:

16

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Institutions	Authors	Share
Southwest University (SWU), China	10.000000 10.000000	0.63
Zunyi Normal College (ZYNC), China	3.000000	0.19
The University of Hong Kong (HKU), China	1.000000	0.06
State Key Laboratory of Organic Electronics and Information Displays, NUPT, China	1.000000	0.06
University of Waterloo, Canada	0.500000	0.03
Xi'an Jiaotong University (XJTU), China	0.500000	0.03

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