True Random Number Generator for Robust Data Security via Intrinsic Stochasticity in a 2D hBN Threshold Switching Memristor

Journal:
Advanced Functional Materials
Published:
DOI:
10.1002/adfm.202522597
Affiliations:
3
Authors:
6
Go to article
Institutions Authors Share
Korea Institute of Science and Technology (KIST), South Korea
3.000000
 0.50
Ewha Womans University (Ewha), South Korea
2.000000
 0.33
Sun Moon University (SMU), South Korea
1.000000
 0.17
Interested in Electronics, Sensors and Digital Hardware?