Large-Area Bi2Te3 Flakes on Si-Based Substrates for Sensitive IR Imaging Photodetection at MWIR Optical Communication Wavelengths

Journal:

Advanced Functional Materials

Published:

2025-10-09

DOI:

10.1002/adfm.202523704

Affiliations:

5

Authors:

13

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Institutions	Authors	Share
Harbin Institute of Technology (HIT), China	9.000000	0.69
Henan University of Science and Technology (HAUST), China	1.000000	0.08
ChangChun University of Science and Technology (CUST), China	1.000000	0.08
HPSTAR (Shanghai), China	1.000000	0.08
Institute of Semiconductors (IOS), CAS, China	1.000000	0.08

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