Role of Intrinsic Electron Trapping in Negative Charging of Amorphous Alumina

Journal:

Advanced Functional Materials

Published:

2026-06-17

DOI:

10.1002/adfm.202526647

Affiliations:

9

Authors:

6

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Institutions	Authors	Share
Norwegian University of Science and Technology (NTNU), Norway	1.333333	0.22
UCL, United Kingdom (UK)	0.833333	0.14
Nanolayers Research Computing Ltd., United Kingdom (UK)	0.666667	0.11
Nanolayers OÜ, Estonia	0.666667	0.11
Aalto University, Finland	0.500000	0.08
Catholic University of Leuven (KU Leuven), Belgium	0.500000	0.08
Interuniversity Microelectronics Centre (IMEC), Belgium	0.500000	0.08
Tampere University, Finland	0.500000	0.08
WPI Advanced Institute for Materials Research (WPI-AIMR), Tohoku University, Japan	0.500000	0.08