Crystallization Kinetics and Perpendicular Anisotropy of YIG Thin Films Grown on SiO2/Si Substrates using Localized Laser Annealing

Journal:

Advanced Functional Materials

Published:

2026-02-03

DOI:

10.1002/adfm.202527741

Affiliations:

4

Authors:

6

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Institutions	Authors	Share
National Engineering Research Center of Electromagnetic Radiation Control Materials, UESTC, China	2.500000	0.42
State Key Laboratory of Electronic Thin Films and Integrated Devices, UESTC, China	2.500000	0.42
Institute of Optics and Electronics (IOE), CAS, China	1.000000	0.17

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