Statistically Resolving Thickness-Dependent Electrical Characteristics in Multilayer-MoS2 Transistors

Journal:
Advanced Functional Materials
Published:
DOI:
10.1002/adfm.202532204
Affiliations:
8
Authors:
12
Go to article
Institutions Authors Share
Ulsan National Institute of Science and Technology (UNIST), South Korea
4.666667
 0.39
Korea Advanced Institute of Science and Technology (KAIST), South Korea
3.333333
 0.28
Hanbat National University, South Korea
1.000000
 0.08
Hanyang University (HYU), South Korea
1.000000
 0.08
TDS Innovation, South Korea
1.000000
 0.08
Washington University in St. Louis (WUSTL), United States of America (USA)
1.000000
 0.08
Interested in Macromolecular and Materials Chemistry?