Tracing Sub-Monolayer Contamination on Wafer-Scale 2D Materials

Journal:
Advanced Functional Materials
Published:
DOI:
10.1002/adfm.75366
Affiliations:
2
Authors:
8
Institutions Authors Share
University of Cambridge, United Kingdom (UK)
7.500000
0.94
STFC Rutherford Appleton Laboratory (RAL), United Kingdom (UK)
0.500000
0.06