Tracing Sub-Monolayer Contamination on Wafer-Scale 2D Materials
- Journal:
- Advanced Functional Materials
- Published:
- DOI:
- 10.1002/adfm.75366
- Affiliations:
- 2
- Authors:
- 8
| Institutions | Authors | Share |
|---|---|---|
| University of Cambridge, United Kingdom (UK) | 0.94 | |
| STFC Rutherford Appleton Laboratory (RAL), United Kingdom (UK) | 0.06 |