Embedded Percolated Metallic Networks With Ultrathin Conformal Coverage for Enhanced Silicon Hot-Electron SWIR Photodetection and Single-Pixel Imaging

Journal:
Advanced Functional Materials
Published:
DOI:
10.1002/adfm.75918
Affiliations:
5
Authors:
10
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Institutions Authors Share
Soochow University, China
7.666667
 0.77
Jincheng Research Institute of Opto‐Mechatronics Industry, China
1.333333
 0.13
Northeast Normal University (NENU), China
1.000000
 0.10
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