Polarization Sensitive Vacuum-Ultraviolet Photodetectors Based on m-Plane h-BN

Journal:

Advanced Materials

Published:

2025-05-12

DOI:

10.1002/adma.202503846

Affiliations:

4

Authors:

8

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Institutions	Authors	Share
Dalian University of Technology (DUT), China	4.000000	0.50
State Key Laboratory of High Pressure and Superhard Materials, JLU, China	3.000000	0.38
Shanghai Synchrotron Radiation Facility (SSRF), SARI CAS, China	1.000000	0.13

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