Quantitatively Predicting Angle‐Resolved Polarized Raman Intensity of Anisotropic Layered Materials

Journal:

Advanced Materials

Published:

2025-07-16

DOI:

10.1002/adma.202506241

Affiliations:

3

Authors:

11

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Institutions	Authors	Share
State Key Laboratory of Semiconductor Physics and Chip Technologies, IOS CAS, China	4.500000	0.41
University of Chinese Academy of Sciences (UCAS), China	4.500000	0.41
Shenzhen Engineering Center for the Fabrication of Two-dimensional Atomic Crystals, SIAT CAS, China	2.000000	0.18

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