Characterization of Complex Stacking of Semiconductors Through Near Field Imaging and Spectroscopy

Journal:
Advanced Materials
Published:
DOI:
10.1002/adma.202507645
Affiliations:
4
Authors:
9
Go to article
Institutions Authors Share
University of Paris-Saclay, France
3.000000
 0.33
Institut d'Electronique et des Systèmes (IES), France
3.000000
 0.33
Laboratory for Microstructural Investigations (LEM), France
2.000000
 0.22
Paris Institute of Nanosciences (INSP), France
1.000000
 0.11
Interested in Electronics, Sensors and Digital Hardware?