Eliminating Mobility‐Thickness Dependence in Transparent Conductive Oxide Layer Growth: A Critical Nucleation Strategy

Journal:

Advanced Materials

Published:

2025-08-14

DOI:

10.1002/adma.202507648

Affiliations:

4

Authors:

11

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Institutions	Authors	Share
Sun Yat-sen University (SYSU), China	3.666667	0.33
State Key Laboratory of Optoelectronic Materials and Technologies (OEMT), SYSU, China	3.666667	0.33
Shenzhen S.C. New Energy Technology Corporation Co. Ltd., China	3.000000	0.27
Sichuan Yat-Sen Innovation Center of Photovoltaic Industry, China	0.666667	0.06

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