Highly Tunable Synaptic Modulation in Photo-Activated Remote Charge Trap Memory for Hardware-Based Fault-Tolerant Learning

Journal:

Advanced Materials

Published:

2025-10-03

DOI:

10.1002/adma.202515140

Affiliations:

7

Authors:

13

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Institutions	Authors	Share
Sungkyunkwan University (SKKU), South Korea	6.500000	0.50
Post-Silicon Semiconductor Institute, KIST, South Korea	2.833333	0.22
Korea Institute of Science and Technology (KIST), South Korea	1.000000	0.08
Hanyang University (HYU), South Korea	1.000000	0.08
KIST School, UST, South Korea	0.833333	0.06
KU-KIST Graduate School of Converging Science and Technology, South Korea	0.833333	0.06

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